发明名称 |
Fabrication method of nitride forming on silicon substrate |
摘要 |
The invention is directed to a method for forming a nitride on a silicon substrate. In the method of the present invention, a silicon substrate is provided and a buffer layer is formed on the silicon substrate. The formation of the buffer layer includes a multi-level temperature modulation process having a plurality temperature levels and a plurality of temperature modulations. For each of the temperature modulations, the temperature is gradually decreased. A nitride is formed on the buffer layer. |
申请公布号 |
US9281184(B2) |
申请公布日期 |
2016.03.08 |
申请号 |
US201213442885 |
申请日期 |
2012.04.10 |
申请人 |
NATIONAL TAIWAN UNIVERSITY |
发明人 |
Yang Chih-Chung;Chen Chih-Yen |
分类号 |
H01L21/20;H01L21/02 |
主分类号 |
H01L21/20 |
代理机构 |
Jianq Chyun IP Office |
代理人 |
Jianq Chyun IP Office |
主权项 |
1. A method for forming nitride on a silicon substrate, comprising:
providing a silicon substrate; forming a buffer layer on the silicon substrate by a multi-level temperature modulation having a plurality of temperature modulations and a plurality of temperature levels, wherein each temperature modulation comprises decreasing a process temperature, the process temperature ramps down from one temperature level to another in each temperature modulation and the process temperature at each temperature level remains unchanged until a thickness increasing amount of the buffer layer at the corresponding temperature level reaches a predetermined thickness, wherein the temperature levels successively decrease, there are n temperature levels, the process temperature at each i temperature level is lower than the process temperature at each corresponding i−1 temperature level, and 1<i≦n; and forming a nitride on the buffer layer. |
地址 |
Taipei TW |