发明名称 HIGH-FREQUENCY MEASURING DEVICE AND HIGH-FREQUENCY MEASURING DEVICE CALIBRATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method capable of facilitating calibrating a high-frequency measuring device.SOLUTION: A high-frequency measuring device including a sensor head 31 and an arithmetic device 32 is configured so that a network analyzer 8 is connected to the sensor head 31, an incident signal is input to an input end P1' of the sensor head 31, a reference load is reproduced at an output end P2', a transmission signal output from a current signal output port P3' of the sensor head 31 and a transmission signal output from a voltage signal output port P4' thereof are detected, and an S parameter is calculated. Furthermore, a signal generator 9 is connected to the arithmetic device 32 and two reproduction signals are generated by the signal generator 9 on the basis of the S parameter and are input to the arithmetic device 32 to cause the arithmetic device 32 to calculate an impedance. A calibration parameter is calculated on the basis of a true value of an impedance of the reference load and the impedance calculated by the arithmetic device 32.SELECTED DRAWING: Figure 5
申请公布号 JP2016031327(A) 申请公布日期 2016.03.07
申请号 JP20140154605 申请日期 2014.07.30
申请人 DAIHEN CORP 发明人 NAKAYAMA MAKI;AMADATE SHIGEKI;NOTOMI HAYATO
分类号 G01R27/28;G01R35/00 主分类号 G01R27/28
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