发明名称 ABNORMALITY DIAGNOSIS APPARATUS, ABNORMALITY DIAGNOSIS METHOD, AND ABNORMALITY DIAGNOSIS PROGRAM
摘要 PROBLEM TO BE SOLVED: To improve detection accuracy for abnormality diagnosis.SOLUTION: An abnormality diagnosis apparatus comprises: preprocessing means determining singular values from a correlation matrix of normal data represented by values of respective parameters at normal time and identifying the number of higher singular values from the determined singular values under a predetermined condition; calculation means calculating a Mahalanobis distance divided by the number of higher singular values, using a pseudo inverse matrix of a correlation matrix of normal data obtained by using diagnosis data represented by values of diagnostic parameters measured at the same time and higher singular values in the number of higher singular values identified by the preprocessing; and determination means determining that an abnormality occurs if the Mahalanobis distance calculated by the calculation means is greater than a predetermined threshold.SELECTED DRAWING: Figure 1
申请公布号 JP2016031568(A) 申请公布日期 2016.03.07
申请号 JP20140152539 申请日期 2014.07.28
申请人 IHI CORP 发明人 NICOLAS SCHMIT
分类号 G05B23/02 主分类号 G05B23/02
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