发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To reduce the thickness and the thermal resistance of a semiconductor device.SOLUTION: A semiconductor device comprises: a substrate; a semiconductor element provided on the substrate; an encapsulation resin that covers the semiconductor element; and a heat radiation plate provided in the encapsulation resin, and that has first and second heat radiation parts arranged on the semiconductor element. At least a part of the second heat radiation part is exposed from a lateral face of the encapsulation resin. The second heat radiation part is thicker than the first heat radiation part.SELECTED DRAWING: Figure 5 |
申请公布号 |
JP2016032074(A) |
申请公布日期 |
2016.03.07 |
申请号 |
JP20140155152 |
申请日期 |
2014.07.30 |
申请人 |
SOCIONEXT INC |
发明人 |
TAKENAKA MASAJI;YAMAMOTO KATSUYOSHI |
分类号 |
H01L23/29;H01L21/56;H01L23/31 |
主分类号 |
H01L23/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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