发明名称 INSPECTION DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a technique to efficiently perform scanning by probe light radiating terahertz waves.SOLUTION: An inspection device 100 inspects a solar battery 9 on which an electrode wiring pattern is formed. The inspection device 100 comprises: a sample table 4 for holding the solar battery 9; a stage driving mechanism 31 for scanning the solar battery 9 by pulse light LP11 by moving the sample table 4 in an X-axis direction and a Y-axis direction; and a terahertz-wave detection unit 23 for detecting a terahertz-wave pulse LT1 radiated by the solar battery 9 in response to the irradiation of the pulse light LP11. In addition, the inspection device 100 comprises: a wiring pattern information acquisition unit 711 for acquiring wiring pattern information 83 indicating the position of a bus-bar electrode 93; and a control unit 7 for controlling the stage driving mechanism 31 so as to scan, by the pulse light LP11, a region of the solar battery 9 excluding at least part of the wiring pattern on the basis of the wiring pattern information 83.SELECTED DRAWING: Figure 4
申请公布号 JP2016029345(A) 申请公布日期 2016.03.03
申请号 JP20140151593 申请日期 2014.07.25
申请人 SCREEN HOLDINGS CO LTD 发明人 MISUHATA MINORU
分类号 G01N21/956;G01M11/00;G01N21/3581;G01R31/26;H02S50/15 主分类号 G01N21/956
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