发明名称 MULTI-BIT FLIP-FLOP WITH ENHANCED FAULT DETECTION
摘要 A processing system includes a processor core, a peripheral component, and a flip-flop unit in at least one of the processor core and the peripheral component. The flip-flop unit can include a master latch, and two slave latches coupled to an output of the master latch. The first slave latch is formed over a first doped well region of a semiconductor substrate. The second slave latch is formed over a second doped well region of the semiconductor substrate. A comparator is coupled to an output of the first slave latch and to an output of the second slave latch. An output of the comparator indicates whether a state stored in the first slave latch is the same as a state stored in the second slave latch.
申请公布号 US2016065185(A1) 申请公布日期 2016.03.03
申请号 US201414472809 申请日期 2014.08.29
申请人 Jarrar Anis M.;Boyer John M.;George Saji;Tipple David R. 发明人 Jarrar Anis M.;Boyer John M.;George Saji;Tipple David R.
分类号 H03K3/037;H03K19/20;G06F11/07;H03K19/0175 主分类号 H03K3/037
代理机构 代理人
主权项 1. A processing system, comprising: a processor core; a peripheral component; a flip-flop unit in at least one of the processor core and the peripheral component, the flip-flop unit including: a master latch;a first slave latch coupled to an output of the master latch, wherein the first slave latch is formed over a first doped well region of a semiconductor substrate;a second slave latch coupled to the output of the master latch, wherein the second slave latch is formed over a second doped well region of the semiconductor substrate; anda comparator coupled to an output of the first slave latch and to an output of the second slave latch, wherein an output of the comparator indicates whether a state stored in the first slave latch is the same as a state stored in the second slave latch.
地址 Austin TX US
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