发明名称 |
MULTI-BIT FLIP-FLOP WITH ENHANCED FAULT DETECTION |
摘要 |
A processing system includes a processor core, a peripheral component, and a flip-flop unit in at least one of the processor core and the peripheral component. The flip-flop unit can include a master latch, and two slave latches coupled to an output of the master latch. The first slave latch is formed over a first doped well region of a semiconductor substrate. The second slave latch is formed over a second doped well region of the semiconductor substrate. A comparator is coupled to an output of the first slave latch and to an output of the second slave latch. An output of the comparator indicates whether a state stored in the first slave latch is the same as a state stored in the second slave latch. |
申请公布号 |
US2016065185(A1) |
申请公布日期 |
2016.03.03 |
申请号 |
US201414472809 |
申请日期 |
2014.08.29 |
申请人 |
Jarrar Anis M.;Boyer John M.;George Saji;Tipple David R. |
发明人 |
Jarrar Anis M.;Boyer John M.;George Saji;Tipple David R. |
分类号 |
H03K3/037;H03K19/20;G06F11/07;H03K19/0175 |
主分类号 |
H03K3/037 |
代理机构 |
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代理人 |
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主权项 |
1. A processing system, comprising:
a processor core; a peripheral component; a flip-flop unit in at least one of the processor core and the peripheral component, the flip-flop unit including:
a master latch;a first slave latch coupled to an output of the master latch, wherein the first slave latch is formed over a first doped well region of a semiconductor substrate;a second slave latch coupled to the output of the master latch, wherein the second slave latch is formed over a second doped well region of the semiconductor substrate; anda comparator coupled to an output of the first slave latch and to an output of the second slave latch, wherein an output of the comparator indicates whether a state stored in the first slave latch is the same as a state stored in the second slave latch. |
地址 |
Austin TX US |