发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME |
摘要 |
Semiconductor devices may include a substrate, gate electrodes on the substrate, and source/drain regions at both sides of each of the gate electrodes. Each of the gate electrodes may include a gate insulating pattern on the substrate, a lower work-function electrode pattern that is on the gate insulating pattern and has a recessed upper surface, and an upper work-function electrode pattern that conformally extends on the recessed upper surface of the lower work-function electrode pattern. Topmost surfaces of the lower work-function electrode patterns may be disposed at an equal level, and the upper work-function electrode patterns may have different thicknesses from each other. |
申请公布号 |
US2016064378(A1) |
申请公布日期 |
2016.03.03 |
申请号 |
US201514826811 |
申请日期 |
2015.08.14 |
申请人 |
KWON Kee Sang;Yoon Boun;Park Sangjine;Song Myunggeun;Ko Ki-Hyung;Yun Jiwon |
发明人 |
KWON Kee Sang;Yoon Boun;Park Sangjine;Song Myunggeun;Ko Ki-Hyung;Yun Jiwon |
分类号 |
H01L27/088;H01L29/78 |
主分类号 |
H01L27/088 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device comprising:
a substrate; a plurality of gate electrodes disposed on the substrate; and source/drain regions disposed at both sides of each of the plurality of gate electrodes, wherein each of the plurality of gate electrodes comprises a gate insulating pattern disposed on the substrate, a lower work-function electrode pattern disposed on the gate insulating pattern and comprising a recessed upper surface, and an upper work-function electrode pattern conformally extending on the recessed upper surface of the lower work-function electrode pattern, wherein topmost surfaces of the lower work-function electrode patterns are disposed at an equal level, and wherein the upper work-function electrode patterns have different thicknesses from each other. |
地址 |
Seoul KR |