发明名称 SEMICONDUCTOR STRUCTURES AND FABRICATION METHODS THEREOF
摘要 A method for forming a semiconductor structure is provided. The method includes providing a substrate having a device region; and forming a sacrificial layer on a surface of the substrate in the device region. The method also includes forming a device layer having a plurality of openings exposing a portion of the surface of the sacrificial layer on the sacrificial layer; and removing the sacrificial layer to expose the surface of the substrate in the device region. Further, the method includes forming a cavity in the substrate in the device region by simultaneously etching the surface of the substrate in the device region exposed by the removed sacrificial layer and the plurality of openings using an anisotropic etching process.
申请公布号 US2016060097(A1) 申请公布日期 2016.03.03
申请号 US201514800777 申请日期 2015.07.16
申请人 Semiconductor Manufacturing International (Shanghai) Corporation 发明人 ZHANG XIANMING;DING JINGXIU
分类号 B81B1/00;B81C1/00 主分类号 B81B1/00
代理机构 代理人
主权项 1. A method for fabricating a semiconductor structure, comprising: providing a substrate having a device region; forming a sacrificial layer on a surface of the substrate in the device region; forming a device layer having a plurality of openings exposing a portion the sacrificial layer on the sacrificial layer; removing the sacrificial layer to expose the surface of the substrate in the device region; and forming a cavity in the substrate in the device region by simultaneously etching the surface of the substrate in the device region exposed by the removed sacrificial layer and the plurality of openings using an anisotropic etching process.
地址 Shanghai CN