BIAXIAL MEASURING DEVICE AND METHOD FOR DETERMINING NORMAL AND SHEAR STRESS-CORRELATED MATERIAL PARAMETERS

摘要

The present invention relates to a biaxial measuring device (1) and a method for determining normal and shear stress-correlated material parameters using said measuring device (1), and to a suspension device and a measuring arrangement. The measuring device (1) has a frame (2) for clamping a flat sample (4) and a plurality of drives (3a, 3b) for applying normal and shear stresses to the sample (4). The sample (4) is provided with a character grid, the orientation of which correlates with orthotropic directions of the sample (4). The sample (4) is clamped into the frame (2) and a first character grid position is detected. Subsequently, predetermined normal and shear stresses are applied simultaneously to the sample (4) and said sample is changed over to a deformed state. The position of the character grid is again detected, then the relative position change of the character grid, displacements and a current distortion state of the sample (4) are determined. A deformation equilibrium of the deformed state of the sample (4) and the material parameters are ascertained therefrom.