发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 A semiconductor device and a manufacturing method of the same are provided. The semiconductor device includes a substrate, a first dielectric layer, a first conductive layer, and an isolation structure. The substrate has a trench. The first dielectric layer is disposed on the substrate between two neighboring trenches. The first conductive layer is disposed on the first dielectric layer. The isolation structure, including a step zone and a recessed zone, is disposed in the trench, wherein an upper surface of the step zone is higher than an upper surface of the first dielectric layer.
申请公布号 US2016064479(A1) 申请公布日期 2016.03.03
申请号 US201414468832 申请日期 2014.08.26
申请人 MACRONIX International Co., Ltd. 发明人 Hsu Fang-Hao;Lee Hong-Ji
分类号 H01L29/06;H01L21/762 主分类号 H01L29/06
代理机构 代理人
主权项 1. A semiconductor device, comprising: a substrate comprising a plurality of trenches; a plurality of first dielectric layers respectively disposed on the substrate between two adjacent trenches; a plurality of first conductive layers disposed on the first dielectric layers; and a plurality of isolation structures disposed in the trenches, wherein each of the isolation structures comprises a step zone and a recessed zone, and an upper surface of the step zone is higher than an upper surface of the first dielectric layer.
地址 Hsinchu TW