发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
A semiconductor device and a manufacturing method of the same are provided. The semiconductor device includes a substrate, a first dielectric layer, a first conductive layer, and an isolation structure. The substrate has a trench. The first dielectric layer is disposed on the substrate between two neighboring trenches. The first conductive layer is disposed on the first dielectric layer. The isolation structure, including a step zone and a recessed zone, is disposed in the trench, wherein an upper surface of the step zone is higher than an upper surface of the first dielectric layer. |
申请公布号 |
US2016064479(A1) |
申请公布日期 |
2016.03.03 |
申请号 |
US201414468832 |
申请日期 |
2014.08.26 |
申请人 |
MACRONIX International Co., Ltd. |
发明人 |
Hsu Fang-Hao;Lee Hong-Ji |
分类号 |
H01L29/06;H01L21/762 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
|
主权项 |
1. A semiconductor device, comprising:
a substrate comprising a plurality of trenches; a plurality of first dielectric layers respectively disposed on the substrate between two adjacent trenches; a plurality of first conductive layers disposed on the first dielectric layers; and a plurality of isolation structures disposed in the trenches, wherein each of the isolation structures comprises a step zone and a recessed zone, and an upper surface of the step zone is higher than an upper surface of the first dielectric layer. |
地址 |
Hsinchu TW |