发明名称 SEMICONDUCTOR DEVICE HAVING PASSING GATE AND METHOD OF THE SAME
摘要 The present invention relates to a semiconductor device to prevent the degradation of properties of a cell transistor using a passing gate effect. The semiconductor device includes: an element separation film limiting an active section; a main gate embedded in the active section and having a multi-layer structure; and a passing gate embedded in the element separation film and having a single layer structure.
申请公布号 KR20160023184(A) 申请公布日期 2016.03.03
申请号 KR20140109102 申请日期 2014.08.21
申请人 SK HYNIX INC. 发明人 JANG, TAE SU;KYE, JEONG SEOB
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
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