发明名称 MASK PATTERN STRUCTURES, METHODS OF FORMING HOLES USING THE SAME, AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES USING THE SAME
摘要 In a method of forming holes, a plurality of guide patterns physically spaced apart from each other is formed on an object layer. The guide pattern has a ring shape and includes a first opening therein. A self-aligned layer is formed on the object layer and the guide patterns to fill the first opening. Preliminary holes are formed by removing portions of the self-aligned layer which are self-assembled in the first opening and between the guide patterns neighboring each other. The object layer is partially etched through the preliminary holes.
申请公布号 US2016064235(A1) 申请公布日期 2016.03.03
申请号 US201514687453 申请日期 2015.04.15
申请人 NAM JAE-WOO;KIM EUN-SUNG 发明人 NAM JAE-WOO;KIM EUN-SUNG
分类号 H01L21/308;H01L21/02;H01L21/027 主分类号 H01L21/308
代理机构 代理人
主权项 1. A method of forming holes, the method comprising: forming a plurality of guide patterns physically spaced apart from each other on an object layer, each of the guide patterns having a ring shape and including a first opening therein; forming a self-aligned layer on the object layer and the guide patterns to fill the first openings; forming preliminary holes by removing portions of the self-aligned layer which are self-assembled in the first openings and between the guide patterns neighboring each other; and partially etching the object layer through the preliminary holes.
地址 ANYANG-SI KR