发明名称 |
MASK PATTERN STRUCTURES, METHODS OF FORMING HOLES USING THE SAME, AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES USING THE SAME |
摘要 |
In a method of forming holes, a plurality of guide patterns physically spaced apart from each other is formed on an object layer. The guide pattern has a ring shape and includes a first opening therein. A self-aligned layer is formed on the object layer and the guide patterns to fill the first opening. Preliminary holes are formed by removing portions of the self-aligned layer which are self-assembled in the first opening and between the guide patterns neighboring each other. The object layer is partially etched through the preliminary holes. |
申请公布号 |
US2016064235(A1) |
申请公布日期 |
2016.03.03 |
申请号 |
US201514687453 |
申请日期 |
2015.04.15 |
申请人 |
NAM JAE-WOO;KIM EUN-SUNG |
发明人 |
NAM JAE-WOO;KIM EUN-SUNG |
分类号 |
H01L21/308;H01L21/02;H01L21/027 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming holes, the method comprising:
forming a plurality of guide patterns physically spaced apart from each other on an object layer, each of the guide patterns having a ring shape and including a first opening therein; forming a self-aligned layer on the object layer and the guide patterns to fill the first openings; forming preliminary holes by removing portions of the self-aligned layer which are self-assembled in the first openings and between the guide patterns neighboring each other; and partially etching the object layer through the preliminary holes. |
地址 |
ANYANG-SI KR |