TEST SOCKET FOR SEMICONDUCTOR DEVICE AND TEST DEVICE INCLUDING THE SAME

摘要

Provided are a test socket for a semiconductor device and a test device including the test socket. The test device includes a test socket including terminals arranged in a two-dimensional array and corresponding to terminals of the semiconductor device and a ground line extending along at least one row of two-dimensional array; and a substrate electrically connected to the test socket so as to transmit and receive a test signal. The test socket includes a ground line extending along at least one row of the two-dimensional array.

主权项

1. A test device, comprising:
a test socket having a first surface that comes in contact with a semiconductor device to be tested, a second surface opposite the first surface, and a two-dimensional array of terminals that correspond to terminals of the semiconductor device, the test socket including a ground line extending along at least one row of the terminals in the two-dimensional array of the terminals; and a substrate electrically connected to the test socket so as to transmit and receive a test signal.