| 摘要 |
The invention relates to a method for processing a measurement signal that is captured by a measuring device, wherein, in order to capture the measurement signal, the measuring device emits a transmitted signal and receives a component of the transmitted signal that is reflected by an object as a received signal, wherein a first phase difference between a first target phase position and a first actual phase position contained in the measurement signal is determined, and wherein a second phase difference between a second target phase position and a second actual phase position contained in the measurement signal is determined, and a phase difference progression in the form of an, in particular linear, functional relationship is determined on the basis of the first and the second phase difference, and a measured value is determined by means of the functional relationship. |
