| 摘要 |
A method for evaluating signals at an x-ray analysis device suitable for analysing a sample of crystalline substances, characterized by the following method steps: irradiating the sample with x-ray radiation, recording the scattered x-ray radiation using a detector, repeating the recording with a modified stress parameter for the sample, subtracting at least one pair of recordings at different stress parameters, analysing at least one difference image in respect of whether one or more reflections within the recorded Debye-Scherrer rings have a greater change in intensity than the surrounding reflections of the Debye-Scherrer rings, performing a quantitative analysis in relation to the extent of which crystals contained in the sample are rotated. |
