发明名称 |
RESISTIVE MEMORY DEVICE AND OPERATING METHOD THEREOF |
摘要 |
Disclosed are a cross point array structure memory device, a memory system, and a method for operating the memory device. The memory device includes multiple tiles, and each of the tiles includes memory cells of multiple layers. A method for operating the memory device having a cross point array according to a technical field of the present invention comprises the following steps: accessing multiple memory cells of a first layer disposed in a region in which one or more first lines and second lines cross, in a first tile; accessing multiple memory cells of a second layer disposed in a region in which one or more first lines and second lines cross, in the first tile; and accessing memory cells of multiple layers of the first tiles, and accessing multiple memory cells disposed in a second tile. |
申请公布号 |
KR20160023480(A) |
申请公布日期 |
2016.03.03 |
申请号 |
KR20140109957 |
申请日期 |
2014.08.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, HYUN KOOK;YOON, CHI WEON;BYEON, DAE SEOK;LEE, YEONG TAEK |
分类号 |
G11C16/08;G11C16/30 |
主分类号 |
G11C16/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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