发明名称 RESISTIVE MEMORY DEVICE AND OPERATING METHOD THEREOF
摘要 Disclosed are a cross point array structure memory device, a memory system, and a method for operating the memory device. The memory device includes multiple tiles, and each of the tiles includes memory cells of multiple layers. A method for operating the memory device having a cross point array according to a technical field of the present invention comprises the following steps: accessing multiple memory cells of a first layer disposed in a region in which one or more first lines and second lines cross, in a first tile; accessing multiple memory cells of a second layer disposed in a region in which one or more first lines and second lines cross, in the first tile; and accessing memory cells of multiple layers of the first tiles, and accessing multiple memory cells disposed in a second tile.
申请公布号 KR20160023480(A) 申请公布日期 2016.03.03
申请号 KR20140109957 申请日期 2014.08.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, HYUN KOOK;YOON, CHI WEON;BYEON, DAE SEOK;LEE, YEONG TAEK
分类号 G11C16/08;G11C16/30 主分类号 G11C16/08
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