发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 A semiconductor device is disclosed. The semiconductor device includes: a substrate; a first metal gate on the substrate; a first hard mask on the first metal gate; an interlayer dielectric (ILD) layer on top of and around the first metal gate; and a patterned metal layer embedded in the ILD layer, in which the top surface of the patterned metal layer is lower than the top surface of the first hard mask.
申请公布号 US2016064327(A1) 申请公布日期 2016.03.03
申请号 US201414494607 申请日期 2014.09.24
申请人 UNITED MICROELECTRONICS CORP. 发明人 Lin Ching-Ling;Huang Chih-Sen;Hung Ching-Wen;Wu Jia-Rong;Chang Tsung-Hung;Lee Yi-Hui;Chen Yi-Wei
分类号 H01L23/535;H01L21/768 主分类号 H01L23/535
代理机构 代理人
主权项 1. A method for fabricating semiconductor device, comprising: providing a substrate, wherein the substrate comprises a first metal gate and a second metal gate thereon, a first hard mask on the first metal gate and a second hard mask on the second metal gate, and a first interlayer dielectric (ILD) layer around the first metal gate and the second metal gate; utilizing the first hard mask and the second hard mask as mask to remove part of the first ILD layer for forming a recess; and forming a patterned metal layer in the recess, wherein the top surface of the patterned metal layer is lower than the top surfaces of the first hard mask and the second hard mask.
地址 Hsin-Chu City TW