TEST ACCESS PORT WITH ADDRESS AND COMMAND CAPABILITY

摘要

The disclosure provides a novel method and apparatus for inputting addresses to devices to select the device TAP for access. Further, the disclosure provides a novel method and apparatus for inputting addresses for selecting device TAPs and for inputting commands for commanding circuitry within the device. The inputting of addresses or the inputting of addresses and commands is initiated by a control bit input on TDI that is recognized during the Run Test/Idle, Pause-DR or Pause-IR TAP states.

主权项

1. Addressable test access port circuitry comprising:
(a) test access port circuitry having a TDI input lead, a TMS input lead, a TCK input lead, and a TDO output lead; (b) test access port control circuitry including state machine circuitry, the control circuitry having a TCK input coupled with the TCK input lead, a TMS input coupled with the TMS input lead, and state outputs indicating Run Test/Idle, Pause-DR and Pause-IR TAP states; (c) addressing circuitry having a TDI input coupled to the TDI input lead, a TMS input couple to the TMS input lead, a TCK input coupled to the TCK input lead, and state inputs coupled to the state outputs, the addressing circuitry including:
(i) address control circuitry having a TDI input coupled to the TID input lead, a TCK input coupled to the TCK input lead, a gated state input, and an update output; and(ii) address detect circuitry having a TDI input coupled to the TDI input lead, a Pause input coupled to the state outputs, a Run Test/Idle input coupled to the state outputs, an update input coupled to the update output, and an enable output; and (d) gating circuitry having one input connected to the TMS input lead, another input connected to the enable output, and an output connected to the TMS input of the test access port control circuitry.