发明名称 |
PARAMETER MODELING FOR SEMICONDUCTOR ARRANGEMENTS |
摘要 |
One or more systems and techniques for modeling are provided. An original device model, such as a SPICE model, is used as a basis for fabricating a semiconductor arrangement, such as an integrated circuit arrangement, upon a semiconductor wafer. Fabrication process variations cause measured e-parameters and measured size e-parameters of the semiconductor arrangement to vary from original design parameters of the original device model. Accordingly, a partial set of e-parameters and a partial set of size e-parameters are measured from the semiconductor arrangement, and are expanded into a full set of e-parameters and a full set of size e-parameters using e-parameter derivation and size-centric derivation. The original device model is retargeted using the full set of e-parameters and the full set of size e-parameters to create a new device model that more accurately represents the real-world or fabricated semiconductor arrangement. |
申请公布号 |
US2016063157(A1) |
申请公布日期 |
2016.03.03 |
申请号 |
US201514612526 |
申请日期 |
2015.02.03 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
Huang Mu-Jen;Hu Zhi Zhong;Cao Zong-Iiang;Zhu Feng |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
1. A method for modeling, comprising:
obtaining a partial set of e-parameters measured from a semiconductor arrangement, the partial set of e-parameters comprising one or more measured e-parameters; performing e-parameter derivation to expand the partial set of e-parameters to a full set of e-parameters, the full set of e-parameters comprising one or more derived e-parameters; and retargeting an original device model for the semiconductor arrangement using the full set of e-parameters to create a new device model that models the semiconductor arrangement. |
地址 |
Hsin-Chu TW |