发明名称 FOURIER TRANSFORM INFRARED SPECTROMETER
摘要 A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamber 2 and an interference optical system are mounted, where an accessory 20 can be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading means 22 for reading accessory information provided to the accessory 20 when the accessory 20 is mounted in the sample chamber 2; and setting condition changing means (controller 30) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means 22, the setting condition varying depending on, e.g., a difference in weight between respective accessories 20.
申请公布号 EP2963400(A4) 申请公布日期 2016.03.02
申请号 EP20130876680 申请日期 2013.02.28
申请人 SHIMADZU CORPORATION 发明人 FUKUDA, HISATO
分类号 G01J3/45;G01J3/02;G01J3/453 主分类号 G01J3/45
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