发明名称 |
JUNCTION BARRIER SCHOTTKY DIODE HAVING EPI RE-GROWTH PATTERN AND METHOD FOR PRODUCING SAME |
摘要 |
The present invention relates to a manufacturing method of a junction barrier schottky diode with epi re-growth patterns. The manufacturing method comprises: (a) a step of forming an N-type epi layer on an N+ type substrate; (b) a step of forming multiple ohmic contact patterns for P+ junction at regular intervals inside the upper part of the first N-type epi layer by inserting P+ semiconductor foreign material ions from the upper part through mask patterns for forming P+ implants; (c) a step of growing a second N type epi-layer of a certain width on the upper part of the first N-type epi layer on which the multiple ohmic contact patterns for P+ junction are formed; (d) a step of forming epi re-growth patterns of which the trapezoid shaped protruding parts are continuously arranged by etching the second N-typed epi layer; and (e) a step of forming a Schottky metal terminal layer of a certain width along the upper surface of the epi re-growth patterns. |
申请公布号 |
KR101598512(B1) |
申请公布日期 |
2016.03.02 |
申请号 |
KR20140112452 |
申请日期 |
2014.08.27 |
申请人 |
MAPLESEMICONDUCTOR. INC. |
发明人 |
JUNG, EUN SIK;KIM, WOO TAEK;PARK, TAE SU;YANG, CHANG HEON |
分类号 |
H01L29/872;H01L21/20 |
主分类号 |
H01L29/872 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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