发明名称 METHOD AND DEVICE FOR MEASURING DEPOSITS IN THE INTERIOR OF AN APPARATUS BY USING MICROWAVE RADIATION
摘要 The invention relates to a method for measuring deposits in the interior (12) of an apparatus (10) by using microwave radiation, comprising the steps a) arranging at least one microwave resonator (20) in the interior (12) of the apparatus (10), wherein the interior (36) of the microwave resonator (20) is connected to the interior (12) of the apparatus (10) such that an exchange of material can take place, or forming the interior of the apparatus (10) as at least one microwave resonator (20), b) introducing microwave radiation into the at least one microwave resonator (20) and c) determining a resonant frequency and/or a quality of a resonance of the at least one microwave resonator (20) , wherein the steps b) and c) are repeated and, from a change in the resonant frequency and/or the quality of a resonance of the at least one microwave resonator (20), conclusions are drawn about the quantity and/or type of deposits in the interior (12) of the apparatus (10). Furthermore, the invention relates to a device for carrying out the method.
申请公布号 EP2989450(A1) 申请公布日期 2016.03.02
申请号 EP20140720545 申请日期 2014.04.22
申请人 BASF SE 发明人 WAGLÖHNER, STEFFEN;HENNIG, INGOLF
分类号 G01N22/00 主分类号 G01N22/00
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