THICKNESS MEASURING DEVICE AND METHOD

摘要

A thickness measurement apparatus and method thereof being possible to measure an object to be inspected with required sensitivity stability and accuracy is provided. The thickness measurement apparatus 1 includes: an ultrasonic wave transmission/reception device 10 that receives and transmits an ultrasonic wave to/from a wall of a pipe to be inspected 2, covered with a heat insulation material 3; a support device 11 that supports the ultrasonic wave transmission/ reception device 10 from an outer surface of the pipe to be inspected 2; a thickness calculation device 18 that measures a propagation time of the ultrasonic wave received and transmitted by the ultrasonic wave transmission/reception device 10, and calculates a thickness of the pipe to be inspected 2; a calibration board 12 of which a thickness is predetermined and more than a thickness of a dead zone of the ultrasonic wave transmission/reception device 10; and a calibration board adjustment device 13 that moves the calibration board 12 between a gap between the ultrasonic wave transmission/reception device 10 and the outer surface of the pipe to be inspected 2 and the position being different from the gap.