发明名称 半導体装置
摘要 A semiconductor device includes a semiconductor element with a plurality of gates, an emitter pattern insulated from the plurality of gates and an emitter electrode formed on the emitter pattern, the semiconductor element being formed such that a main current flows into the emitter electrode via the emitter pattern, a first solder formed on a part of the emitter electrode, a second solder formed on a part of the emitter electrode apart from the first solder, and a terminal connected to the emitter electrode by means of the first solder and the second solder, wherein the semiconductor element includes a first solder region, a second solder region and an intermediate region, a density of the gates in each of the solder regions are equal, and a current density of the main current in the intermediate region is lower than current densities of the main currents in the other solder regions.
申请公布号 JP5871050(B2) 申请公布日期 2016.03.01
申请号 JP20140500799 申请日期 2012.02.22
申请人 三菱電機株式会社 发明人 遠井 茂男
分类号 H01L21/60;H01L23/48;H01L25/07;H01L25/18;H01L29/739;H01L29/78 主分类号 H01L21/60
代理机构 代理人
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