发明名称 Method of manufacturing semiconductor device substrate with crystal structure reformation regions
摘要 A method of manufacturing a semiconductor device include preparing an initial substrate including an edge region and a central region in which circuit patterns are formed, forming a reforming region in the edge region of the initial substrate, grinding the initial substrate to form a substrate, and cutting the substrate to form a semiconductor chip including each of the circuit patterns. A crystal structure of the reforming region is different from that of the initial substrate.
申请公布号 US9275903(B2) 申请公布日期 2016.03.01
申请号 US201414488883 申请日期 2014.09.17
申请人 Samsung Electronics Co., Ltd. 发明人 Kwak Byoung-Soo;Kim Youngsu;Park Sangwook;Cho Taeje
分类号 H01L21/78;H01L21/02;H01L21/268;H01L21/683;H01L23/544 主分类号 H01L21/78
代理机构 Harness, Dickey & Pierce 代理人 Harness, Dickey & Pierce
主权项 1. A method of manufacturing a semiconductor device, comprising: preparing an initial substrate including an edge region and a central region, the central region including circuit patterns and a notch; forming a reforming region in the edge region of the initial substrate; grinding the initial substrate to form a substrate; and cutting the substrate to form a semiconductor chip including each of the circuit patterns, wherein a crystal structure of the reforming region is different from a crystal structure of the initial substrate, and wherein forming the reforming region in the edge region of the initial substrate includes irradiating a laser to a portion adjacent to the notch of the initial substrate.
地址 Gyeonggi-Do KR