发明名称 |
Method of manufacturing semiconductor device substrate with crystal structure reformation regions |
摘要 |
A method of manufacturing a semiconductor device include preparing an initial substrate including an edge region and a central region in which circuit patterns are formed, forming a reforming region in the edge region of the initial substrate, grinding the initial substrate to form a substrate, and cutting the substrate to form a semiconductor chip including each of the circuit patterns. A crystal structure of the reforming region is different from that of the initial substrate. |
申请公布号 |
US9275903(B2) |
申请公布日期 |
2016.03.01 |
申请号 |
US201414488883 |
申请日期 |
2014.09.17 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kwak Byoung-Soo;Kim Youngsu;Park Sangwook;Cho Taeje |
分类号 |
H01L21/78;H01L21/02;H01L21/268;H01L21/683;H01L23/544 |
主分类号 |
H01L21/78 |
代理机构 |
Harness, Dickey & Pierce |
代理人 |
Harness, Dickey & Pierce |
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
preparing an initial substrate including an edge region and a central region, the central region including circuit patterns and a notch; forming a reforming region in the edge region of the initial substrate; grinding the initial substrate to form a substrate; and cutting the substrate to form a semiconductor chip including each of the circuit patterns, wherein a crystal structure of the reforming region is different from a crystal structure of the initial substrate, and wherein forming the reforming region in the edge region of the initial substrate includes irradiating a laser to a portion adjacent to the notch of the initial substrate. |
地址 |
Gyeonggi-Do KR |