发明名称 Multi-purpose integrated circuit device contactor
摘要 A contactor uses a pogo block in a first configuration as a direct integrated circuit test socket and the contactor can be reconfigured to provide a pogo block assembly to interface between a main test printed circuit board (PCB) and a daughter card that is dedicated to a specific device handler and/or a specific package type that can be different from the main test PCB. A pogo block is inserted into a thick frame with an alignment plate for contactor use in which a device under test fits into a recess in the frame through an alignment plate to align the device under test to make contact with electrical contacts of the contactor. The frame and guide plate can be removed and a thinner frame coupled to the contactor, which changes its function to a pogo block assembly.
申请公布号 US9274140(B2) 申请公布日期 2016.03.01
申请号 US201313771889 申请日期 2013.02.20
申请人 Silicon Laboratories Inc. 发明人 Rose Larry R.;Gabelmann Craig N.;Zhang Wenshui
分类号 G01R31/20;G01R1/04 主分类号 G01R31/20
代理机构 Abel Law Group, LLP 代理人 Abel Law Group, LLP
主权项 1. A tester apparatus comprising: a first printed circuit board; a pogo block electrically connected to the first printed circuit board on a first side of the pogo block; wherein in a first configuration the pogo block is configured to be electrically connected to a packaged integrated circuit under test; and wherein in a second configuration the pogo block is electrically connected on a second side of the pogo block to a second printed circuit board, wherein the second printed circuit board provides a translation from the first printed circuit board to provide for testing in the second configuration of a device with at least one of a different package size or different electrical contacts than the packaged integrated circuit under test in the first configuration.
地址 Austin TX US