发明名称 Location determination apparatus with an inertial measurement unit
摘要 Some embodiments of the invention relate to a location determination apparatus for determining a location of two components relative to one another. The apparatus may comprise at least one location encoder having a read head in cooperation with a code for generating first position determination data at a first measurement frequency. According to some embodiments of the invention, at least one inertial measurement unit is arranged for additionally determining translational and/or rotational accelerations of at least one of the two components and, moreover, for generating second position determination data with respect to the location at a second measurement rate.
申请公布号 US9273946(B2) 申请公布日期 2016.03.01
申请号 US201414323990 申请日期 2014.07.03
申请人 HEXAGON TECHNOLOGY CENTER GMBH 发明人 Siercks Knut
分类号 G01B7/008;G01D5/20 主分类号 G01B7/008
代理机构 Maschoff Brennan 代理人 Maschoff Brennan
主权项 1. Location determination apparatus for two components, mobile relative to one another, of a measuring machine for determining a location of the two components relative to one another, wherein the location determination apparatus comprises at least one location encoder having a read head in cooperation with a code for generating first position determination data with respect to the location at a first measurement rate, wherein: at least one inertial measurement unit for determining translational and/or rotational accelerations of at least one of the two components and, moreover, for generating second position determination data with respect to the location at a second measurement rate—which is higher than the first measurement rate; and an evaluation unit, which is embodied and configured to acquire the first position determination data generated by the at least one location encoder and the second position determination data generated by the at least one inertial measurement unit, correlate said position determination data with one another and determine the location therefrom at a third measurement rate, which is at least higher than the first measurement rate.
地址 Heerbrugg CH