发明名称 Soft dark bit masking with integrated load modulation and burn-in induced destabilization for physically unclonable function keys
摘要 Embodiments of an invention for soft dark bit masking are disclosed. In one embodiment, an apparatus includes a basic physically unclonable function (PUF) cell, a load, and a masking circuit. The load is selectively connectable to the basic PUF cell to determine whether the basic PUF cell is unstable. The masking circuit is to mask the output of the basic PUF cell if the basic PUF cell is determined to be unstable. Embodiments of the invention also include mechanisms to reinforce the stability of stable cells, while further destabilizing unstable cells.
申请公布号 US9276583(B1) 申请公布日期 2016.03.01
申请号 US201514748591 申请日期 2015.06.24
申请人 Intel Corporation 发明人 Satpathy Sudhir K;Mathew Sanu K
分类号 H03K19/00;H03K19/177;G06F11/07 主分类号 H03K19/00
代理机构 代理人 Lane Thomas R.
主权项 1. An apparatus comprising: a basic physically unclonable function (PUF) cell; a load, the load selectively connectable to the basic PUF cell to determine whether the basic PUF cell is unstable; and a masking circuit to mask the output of the basic PUF cell if the basic PUF cell is determined to be unstable.
地址 Santa Clara CA US