TEST SYSTEM EXECUTING SHORT-TEST OF PLURALITY OF TEST UNITS SIMULTANEOUSLY AND TEST SYSTEM EXECUTING OPEN-TEST OF PLURALITY OF TEST UNITS SIMULTANEOUSLY

摘要

A test system includes a row decoder, a column decoder, a column unit test control part and a test circuit. The row decoder enables one of first to M-th row signals on the basis of a plurality of row input signals. The column decoder enables one of first to N-th column signals on the basis of a plurality of column input signals. The column unit test control part outputs the first to N-th activated column output signals in case a column unit test enable signal is activated, and outputs the first to the N-th column signals as first to N-th column output signals respectively in case the column unit test enable signal is inactivated. The test circuit includes first to M-th row test blocks comprising first to N-th test units. The first to M-th test blocks correspond to first to M-th row signals respectively. The test circuit performs short-circuit test of the first to N-th test units included in the row test block corresponding to the activated row signal among the first to M-th row signals at the same time on the basis of the first and second test signals and the first to N-th column output signals in case the column unit test enable signal is activated.