| 主权项 |
1. A system for characterizing a three-dimensional bi-directional reflectance distribution function scattered light pattern of more than one surfaces of a sample, the system comprising:
a hemispherical-elliptical member comprising an inner surface, the inner surface comprising a non-specular reflective material formed thereon; an entrance port operable to receive electromagnetic radiation from an electromagnetic radiation source; a first reflective optical element operable to receive at least a portion of the electromagnetic radiation and to direct the at least the portion of the electromagnetic radiation onto the portion of the sample to be characterized; a wide-angle lens operable to receive the electromagnetic radiation that was scattered from the more than one surfaces of the sample onto the inner surface of the hemispherical-elliptical member; and an imaging device that protrudes into the hemispherical-elliptical member and is operable to record intensity information imaged by the wide-angle lens to characterize the bi-directional reflectance distribution function scattered light pattern of the more than one surfaces of the sample, wherein the sample protrudes into the hemispherical-elliptical member and is positioned at a first focus point and the imaging device is positioned at a second focus point relative to the hemispherical-elliptical member. |
