| 发明名称 |
MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND VISION CHIP |
| 摘要 |
A measurement system includes: a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates stipulated by a projection coordinate system, and a second pattern image having the same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist; and at least one imaging apparatus that images the first pattern light and generates an imaged image. |
| 申请公布号 |
US2016054118(A1) |
申请公布日期 |
2016.02.25 |
| 申请号 |
US201514850181 |
申请日期 |
2015.09.10 |
| 申请人 |
Panasonic Intellectual Property Corporation of America |
发明人 |
FUCHIKAMI RYUJI |
| 分类号 |
G01B11/25 |
主分类号 |
G01B11/25 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measurement system comprising:
a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates stipulated by a projection coordinate system, and a second pattern image having the same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist; and at least one imaging apparatus that images the first pattern light and generates an imaged image. |
| 地址 |
Torrance CA US |
