发明名称 |
Isolation for Semiconductor Devices |
摘要 |
A system and method for isolating semiconductor devices is provided. An embodiment comprises an isolation region that is laterally removed from source/drain regions of semiconductor devices and has a dielectric material extending over the isolation implant between the source/drain regions. The isolation region may be formed by forming an opening through a layer over the substrate, depositing a dielectric material along the sidewalls of the opening, implanting ions into the substrate after the deposition, and filling the opening with another dielectric material. |
申请公布号 |
US2016056202(A1) |
申请公布日期 |
2016.02.25 |
申请号 |
US201514930183 |
申请日期 |
2015.11.02 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Hsu Wen-I;Kao Min-Feng;Liu Jen-Cheng;Yaung Dun-Nian;Hsu Tzu-Hsuan;Wang Wen-De |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a semiconductor device, the method comprising:
forming an opening through one or more layers over a substrate, the opening comprising sidewalls; depositing a first dielectric layer along the sidewalls of the opening; and implanting first ions into the substrate using the first dielectric layer as a mask, the implanting the first ions forming an isolation region within the substrate. |
地址 |
Hsin-Chu TW |