发明名称 Isolation for Semiconductor Devices
摘要 A system and method for isolating semiconductor devices is provided. An embodiment comprises an isolation region that is laterally removed from source/drain regions of semiconductor devices and has a dielectric material extending over the isolation implant between the source/drain regions. The isolation region may be formed by forming an opening through a layer over the substrate, depositing a dielectric material along the sidewalls of the opening, implanting ions into the substrate after the deposition, and filling the opening with another dielectric material.
申请公布号 US2016056202(A1) 申请公布日期 2016.02.25
申请号 US201514930183 申请日期 2015.11.02
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Hsu Wen-I;Kao Min-Feng;Liu Jen-Cheng;Yaung Dun-Nian;Hsu Tzu-Hsuan;Wang Wen-De
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, the method comprising: forming an opening through one or more layers over a substrate, the opening comprising sidewalls; depositing a first dielectric layer along the sidewalls of the opening; and implanting first ions into the substrate using the first dielectric layer as a mask, the implanting the first ions forming an isolation region within the substrate.
地址 Hsin-Chu TW