发明名称 REAL TIME LIQUID PARTICLE COUNTER (LPC) END POINT DETECTION SYSTEM
摘要 Embodiments of the present invention generally relate to a method and apparatus for ex-situ cleaning of a chamber component. More particularly, embodiments of the present invention generally relate to a method and apparatus for endpoint detection during ex-situ cleaning of a chamber component used in a semiconductor processing chamber. In one embodiment, a system for cleaning parts disposed in a liner with a cleaning fluid is provided. The system comprises a portable cart, a liquid particle counter (LPC) carried by the portable cart, the LPC configured for detachable coupling to a fluid outlet port formed through the liner, the LPC operable to sample rinsate solution exiting the line, and a pump carried by the portable cart and configured for fluid coupling to the liner in a detachable manner, the pump operable to recirculate rinsate solution through the liner.
申请公布号 US2016056061(A1) 申请公布日期 2016.02.25
申请号 US201514933832 申请日期 2015.11.05
申请人 QUANTUM GLOBAL TECHNOLOGIES LLC 发明人 Wang Jiansheng;Stanczyk Barbara;Boyd, JR. Wendell;Papke Kevin A.;Sommers Joseph F.;Do David
分类号 H01L21/67;B08B3/14;B08B3/10;H01L21/677 主分类号 H01L21/67
代理机构 代理人
主权项 1. A system for cleaning parts disposed in a liner with a cleaning fluid, comprising: a portable cart; a liquid particle counter (LPC) carried by the portable cart, the LPC configured for detachable coupling to a fluid outlet port formed through the liner, the LPC operable to sample rinsate solution exiting the liner; and a pump carried by the portable cart and configured for fluid coupling to the liner in a detachable manner, the pump operable to recirculate rinsate solution through the liner.
地址 DUBLIN PA US