发明名称 Sputtering Method Using Sputtering Device
摘要 The present invention relates to a sputtering method using a sputtering device, wherein entire scan region is defined from one side to the other side of a sputtering target, and the sputtering target is scanned with a magnet moving back and forth along the entire scan region multiple times. The entire scan region of a sputtering target is divided by N parts to be uniformly eroded, such that a magnet moves back and forth along some part of the divided entire scan region. A sputtering method using a sputtering device can therefore extend an alternating cycle of a sputtering target, by virtue of improving utilization efficiency of the sputtering target through uniform erosion of the sputtering target, and can also reduce manufacturing cost.
申请公布号 US2016053367(A1) 申请公布日期 2016.02.25
申请号 US201514932005 申请日期 2015.11.04
申请人 Hydis Technologies Co., Ltd. 发明人 Lee Jai Chun
分类号 C23C14/35 主分类号 C23C14/35
代理机构 代理人
主权项
地址 Icheon-si KR