| 摘要 |
A method for measuring the box thickness and the pre-tilt angle of a liquid crystal layer comprises the following steps: step 1, separately defining effective display regions (5) and a plurality of measurement regions (7) located on the peripheries of the effective display regions (5) on an array substrate (1) and a color film substrate (3), and separately making consistent patterns on the effective display regions (5) and the measurement regions (7); step 2, separately coating a glue frame on the effective display regions (5) corresponding to the array substrate (1) and the measurement regions (7) corresponding to the color film substrate (3), and separately dropping liquid crystals into the effective display regions (5) corresponding to the array substrate (1) and the measurement regions (7) corresponding to the color film substrate (3); step 3, performing pair assembly, baking and alignment manufacturing process of the array substrate (1) and the color film substrate (3); and step 4, separately measuring the box thickness and the pre-tilt angle of the liquid crystal layers of the effective display regions (5) and the measurement regions (7), and processing measurement data. By means of the method, the box thickness and the pre-tilt angle of the liquid crystal layers can be accurately measured, the box thickness and the pre-tilt angle can be effectively monitored, and the product quality can be ensured. |
