发明名称 RAMAN SPECTROSCOPY MICROSCOPE AND METHOD FOR OBSERVING RAMAN SCATTERING
摘要 The purpose of the present invention is to achieve a Raman spectroscopy microscope wherein spatial resolution exceeds the diffraction limit of light. A diffraction grating (2) diffracts laser light (L) outputted by a light source (1), producing diffracted light. A spectrometer (4) acquires the optical spectrum of impinging light and the spatial distribution of the optical intensity of the optical spectrum. An optical system (3) illuminates an object to be observed (10) by using interfering light from first-order diffracted light and negative-first-order diffracted light produced by the diffraction grating (2), the interfering light taking the form of line illumination light (LL) for which the lengthwise direction is defined as a first direction, and guides Raman scattered light (Lr) into the spectrometer (4), the Raman scattered light (Lr) being produced by irradiation of the object to be observed (10) using the line illumination light (LL). A controller (5) controls the optical system (3), and scans the object to be observed (10) by using the line illuminating light (LL) in a second direction.
申请公布号 WO2016027453(A1) 申请公布日期 2016.02.25
申请号 WO2015JP04097 申请日期 2015.08.18
申请人 OSAKA UNIVERSITY 发明人 FUJITA, KATSUMASA;KAWATA, SATOSHI;WATANABE, KOZUE
分类号 G01N21/65;G01J3/44;G02B21/06 主分类号 G01N21/65
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