发明名称 |
FILM-FORMING AND ANALYSIS COMPOSITE APPARATUS, METHOD FOR CONTROLLING FILM-FORMING AND ANALYSIS COMPOSITE APPARATUS, AND VACUUM CHAMBER |
摘要 |
A vacuum chamber is provided with a film-forming apparatus which film-forms an oxide semiconductor thin film by sputtering, an analysis apparatus which performs spectroscopic analysis with respect to a surface of the film-formed oxide semiconductor thin film, and a valve which splits an inner space of the vacuum chamber into a first space where the analysis apparatus is arranged and a second space where the film-forming apparatus is arranged and permits communication between the split first space and second space. |
申请公布号 |
US2016054244(A1) |
申请公布日期 |
2016.02.25 |
申请号 |
US201514816169 |
申请日期 |
2015.08.03 |
申请人 |
Sharp Kabushiki Kaisha |
发明人 |
NIINOH Atsushi |
分类号 |
G01N23/227 |
主分类号 |
G01N23/227 |
代理机构 |
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代理人 |
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主权项 |
1. A film-forming and analysis composite apparatus having a function as a vacuum chamber which can make an inner space thereof a vacuum, the apparatus comprising:
a film-forming apparatus which film-forms a sample by sputtering; an analysis apparatus which performs spectroscopic analysis with respect to a surface of the sample which is film-formed; and an interrupting member which splits the inner space into a first space where the analysis apparatus is arranged and a second space where the film-forming apparatus is arranged and permits communication between the split first space and second space. |
地址 |
Osaka JP |