SYSTEM AND METHODS FOR MEASURING OPHTHALMIC LENS

摘要

The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.

主权项

1. A system for characterizing the surface properties of one or both surfaces of a contact lens, the system comprising:
an optics assembly including a light source configured to generate a low coherence light beam; a beam splitter configured to create a first light beam and a second light beam from the light beam generated by the optics assembly; a diverger assembly including at least one lens configured to propagate the first light beam; a measurement assembly configured to house the contact lens and receive the first light beam from said diverger assembly and direct the first light beam to at least one contact lens surface, the at least one contact lens surface creating a first reflected light beam and said measurement assembly being configured to direct the first reflected light beam towards said beam splitter; a reference assembly configured to receive the second light beam and direct a second reflected light beam to said beam splitter to provide a wavefront reference for measuring the contact lens; and an imaging assembly, and wherein said beam splitter being configured to merge the first reflected light beam and the second reflected light beam into a combined light beam and directing the combined light beam to said imaging assembly, and said imaging assembly configured to receive the combined light beam from said beam splitter and create an image with an interference pattern from the combined light beam.