发明名称 |
SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SUBSTRATE PROCESSING METHOD |
摘要 |
With the miniaturization of semiconductors and the increase in the diameter of wafers, the wafer size increases. Therefore, a supply gas flow rate also increases as compared with a process of a conventional wafer size. Thus, it is difficult to perform an exhaust pressure control in the same manner as a conventional processing process. ON/OFF valves provided in a plurality of exhaust pipes communicating with a processing chamber and a vacuum pump, and a controller configured to control the ON/OFF valves are provided, and it is possible to cope with the increase in the diameter of the wafer by performing a valve on/off and pressure control operation in a process event. |
申请公布号 |
US2016053377(A1) |
申请公布日期 |
2016.02.25 |
申请号 |
US201414779729 |
申请日期 |
2014.03.24 |
申请人 |
HITACHI KOKU SAI ELECTRIC INC. |
发明人 |
TANIYAMA Tomoshi |
分类号 |
C23C16/52;H01L21/02;C23C16/44 |
主分类号 |
C23C16/52 |
代理机构 |
|
代理人 |
|
主权项 |
1. A substrate processing apparatus comprising:
a reaction tube configured to process a plurality of substrates carried in a substrate holder; a gas supply unit configured to supply a processing gas into the reaction tube; an exhaust unit connected to the reaction tube and branching into at least two exhaust pipes at a downstream side of a connection portion with the reaction tube, the exhaust unit including a valve configured to control the amount of the exhaust in exhaust pipes, and merged into one exhaust pipe downstream of valves provided in the exhaust pipes; and a control unit configured to fully open all the valves provided in the exhaust unit at a timing to substantially evacuate the reaction tube. |
地址 |
Tokyo JP |