发明名称 |
COMPOSITION FOR FINER RESIST PATTERN, AND FINE PATTERN-FORMING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a composition for finer resist patterns that can make a resist pattern finer precisely and effectively.SOLUTION: A composition for finer resist patterns includes an ion represented by formula (1-1), an ion represented by formula (1-2), an ion represented by formula (2-1), an ion represented by formula (2-2) and a solvent. A total content of these ions is no less than 50% by mass with respect to a sum of components other than the solvent.SELECTED DRAWING: Figure 2 |
申请公布号 |
JP2016028274(A) |
申请公布日期 |
2016.02.25 |
申请号 |
JP20150136458 |
申请日期 |
2015.07.07 |
申请人 |
JSR CORP |
发明人 |
KIRITOSHI YUKO;NII NORIYUKI;FURUKAWA TSUYOSHI;SHIOTANI TAKEO |
分类号 |
G03F7/40;C08F220/28;C09K3/00;G03F7/039;H01L21/027 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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