发明名称 COMPOSITION FOR FINER RESIST PATTERN, AND FINE PATTERN-FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a composition for finer resist patterns that can make a resist pattern finer precisely and effectively.SOLUTION: A composition for finer resist patterns includes an ion represented by formula (1-1), an ion represented by formula (1-2), an ion represented by formula (2-1), an ion represented by formula (2-2) and a solvent. A total content of these ions is no less than 50% by mass with respect to a sum of components other than the solvent.SELECTED DRAWING: Figure 2
申请公布号 JP2016028274(A) 申请公布日期 2016.02.25
申请号 JP20150136458 申请日期 2015.07.07
申请人 JSR CORP 发明人 KIRITOSHI YUKO;NII NORIYUKI;FURUKAWA TSUYOSHI;SHIOTANI TAKEO
分类号 G03F7/40;C08F220/28;C09K3/00;G03F7/039;H01L21/027 主分类号 G03F7/40
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