| 主权项 |
1. A probe for automatic test equipment (ATE) comprising:
an outer shroud comprising a course alignment feature configured to receive a target device and to guide the target device into an interior of the outer shroud, the target device comprising exposed electrical leads; and an inner structure that is at least partly inside the outer shroud, the inner structure comprising electrical contacts for making an electrical connection to the exposed electrical leads, the inner structure comprising a fine alignment feature configured to guide the target device towards the electrical contacts to make the electrical connection. |
