发明名称 X-RAY DETECTOR WITH CORRECTION FOR SCATTERED RADIATION
摘要 The invention refers to X-ray devices, an X-ray detector and a method of correcting intensity signals. An X-ray detector then comprises for determining the intensity of X-rays, which comprise a proportion of primary radiation having an irradiation direction and a proportion of scattered radiation, at least a first sensor elements, which are each provided for converting the X-rays into first and second intensity signals, and a filter element, which is provided for decreasing the proportion of scattered radiation in the intensity of the X-rays, wherein the second sensor elements are arranged in irradiation direction behind the filter element and wherein the first sensor element fastened to the filter element is provided for determining the intensity of the X-rays before leaving the filter element. The proportion of the scattered radiation calculated from the measuring data of the first and second sensor elements is provided for correcting the second intensity signals for the following image generation.
申请公布号 EP1761802(B1) 申请公布日期 2016.02.24
申请号 EP20050752068 申请日期 2005.06.24
申请人 PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;KONINKLIJKE PHILIPS N.V. 发明人 SCHWEIZER, BERND;VOGTMEIER, GEREON;ENGEL, KLAUS, JÜRGEN
分类号 G01T1/164;G04G21/04 主分类号 G01T1/164
代理机构 代理人
主权项
地址
您可能感兴趣的专利