发明名称 METHOD OF FORMING A THIN FILM OF A SEMICONDUCTOR DEVICE
摘要 Disclosed is a method for forming a thin film of a semiconductor device, comprising the following steps: forming a precursor layer on the surface of a substrate by supplying a precursor gas into a chamber; discharging the precursor gas remaining in the chamber to the outside of the chamber by supplying a purge gas into the chamber; supplying a reaction gas into the chamber; generating plasma from the reaction gas; forming a thin film by chemical reaction of the plasma and the precursor layer by radiating extreme ultraviolet (EUV) into the chamber; and discharging the reaction gas and the plasma remaining in the chamber to the outside of the chamber by supplying the purge gas into the chamber.
申请公布号 KR20160021003(A) 申请公布日期 2016.02.24
申请号 KR20140153075 申请日期 2014.11.05
申请人 SAMSUNG ELECTRONICS CO., LTD.;THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY 发明人 KIM SAM HYUNG SAM;ANDREI TEODOR IANCU;FRIEDRICH B. PRINZ;MICHAEL C. LANGSTON;KIM, KI HYUN;PETER SCHINDLER;USUI TAKANE;STEPHEN P WALAH
分类号 H01L21/205;H01L21/02 主分类号 H01L21/205
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