发明名称 |
METHOD OF FORMING A THIN FILM OF A SEMICONDUCTOR DEVICE |
摘要 |
Disclosed is a method for forming a thin film of a semiconductor device, comprising the following steps: forming a precursor layer on the surface of a substrate by supplying a precursor gas into a chamber; discharging the precursor gas remaining in the chamber to the outside of the chamber by supplying a purge gas into the chamber; supplying a reaction gas into the chamber; generating plasma from the reaction gas; forming a thin film by chemical reaction of the plasma and the precursor layer by radiating extreme ultraviolet (EUV) into the chamber; and discharging the reaction gas and the plasma remaining in the chamber to the outside of the chamber by supplying the purge gas into the chamber. |
申请公布号 |
KR20160021003(A) |
申请公布日期 |
2016.02.24 |
申请号 |
KR20140153075 |
申请日期 |
2014.11.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY |
发明人 |
KIM SAM HYUNG SAM;ANDREI TEODOR IANCU;FRIEDRICH B. PRINZ;MICHAEL C. LANGSTON;KIM, KI HYUN;PETER SCHINDLER;USUI TAKANE;STEPHEN P WALAH |
分类号 |
H01L21/205;H01L21/02 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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