| 摘要 |
Provided is a device for thermal analysis capable of highly accurate TG-DSC measurement without a complex measurement procedure. The device for thermal analysis according to the present invention comprises: a pair of sample container assembly sets including a first sample container assembly 101 and a second sample container assembly 102, in each of which a sample container and a heat sink are connected using a member having a predetermined thermal resistance; a heating unit 20 for equally heating the pair of sample container assembly sets; a temperature control unit 400 for controlling the temperature of the heating unit; a weight measurement unit 103 for measuring the weight difference between a sample placed on the sample container 9 of the first sample container assembly and a reference material placed on the sample container 10 of the second sample container assembly; and a temperature measurement unit 300 for measuring the temperature difference between the sample and the reference material, and while the temperature of the heating unit is changed using the temperature control unit, the weight difference and the temperature difference are measured. |
