发明名称 |
METHOD FOR MANUFACTURING THIN FILM LAMINATED ELEMENT |
摘要 |
An object of the present invention is to provide a method for producing a thin-film multilayer device, the method allowing the user to position a photomask for etching using a less-damaged alignment mark. A method according to the present invention for producing a thin-film multilayer device includes a second process in which a device section 10 and an alignment mark are formed on a thin-film multilayer body 7 through photolithographic etching and also includes a third process having a step of applying a photosensitive resist to the thin-film multilayer body 7, a step of placing a photomask having an alignment pattern on the photosensitive resist by aligning the alignment pattern with the alignment mark formed in a previous process, a step of exposing and developing the photosensitive resist, and a step of etching the thin-film multilayer body coated with the photosensitive resist to form a device section and an alignment mark on the thin-film multilayer body. |
申请公布号 |
EP2869332(A4) |
申请公布日期 |
2016.02.24 |
申请号 |
EP20130810224 |
申请日期 |
2013.06.14 |
申请人 |
MURATA MANUFACTURING CO., LTD. |
发明人 |
NOMURA, MASANOBU;TAKESHIMA, YUTAKA |
分类号 |
H01L21/02;G03F9/00;H01G4/12;H01G4/33;H01L21/311;H01L21/60;H01L23/544;H01L27/01;H01L49/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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