| 摘要 |
The present invention relates to a light scattering analysis system which is proper to measure a fine structure of a sample. The present invention provides a small angle light scattering analysis system comprising: an output unit which emits an X-ray beam; a stage unit on which a sample is placed; a detecting unit which detects a scattered beam; a first beam path which guides a path of the X-ray beam between the output unit and the stage unit, blocking the X-ray beam from being emitted outside; a second beam path which blocks the scattered beam from being emitted outside between the stage unit and the detecting unit; a base unit including a rail portion which can be attached and removed from the base unit such that positions of the output unit, the first beam path, the stage unit, the second beam path, and the detecting unit are arranged in a longitudinal direction in a straight line; a sensing line arranged on the rail unit including a plurality of sensors; a terminal unit coupled with a support unit configured on the bottoms of each of the output unit, the first beam path, the stage unit, the second beam path, and the detecting unit such that they can be attached and removed from the rail unit; and a control unit which includes an output managing unit which applies a high voltage to the outputting unit; an image detecting unit which configures an image based on image detection signals, and a short-circuit detecting unit which acknowledges a connection of the terminal units of each facilities with the sensors. When it is determined that the respective facilities are not accurately mounted on the rail unit, the control unit blocks the output from the output unit. |
