发明名称 Semiconductor device and method of fabricating the same
摘要 The present disclosure relates to a semiconductor device including an oxygen gettering layer between a group III-V compound semiconductor layer and a dielectric layer, and a method of fabricating the semiconductor device. The semiconductor device may include a compound semiconductor layer; a dielectric layer disposed on the compound semiconductor layer; and an oxygen gettering layer interposed between the compound semiconductor layer and the dielectric layer. The oxygen gettering layer includes a material having a higher oxygen affinity than a material of the compound semiconductor layer.
申请公布号 EP2843706(A3) 申请公布日期 2016.02.24
申请号 EP20140178402 申请日期 2014.07.24
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 LEE, DONG-SOO;LEE, MYOUNG-JAE;CHO, SEONG-HO;UDDIN, MOHAMMAD RAKIB;SEO, DAVID;YANG, MOON-SEUNG;LEE, SANG-MOON;LEE, SUNG-HUN;HUR, JI-HYUN;HWANG, EUI-CHUL
分类号 H01L29/51;H01L21/28;H01L21/336;H01L29/20;H01L29/24;H01L29/78 主分类号 H01L29/51
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