发明名称 Device for the electromagnetic testing of an object
摘要 The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes, a structure for supporting the network of probes and a support for supporting the object being tested. According to the invention, the structure is closed in the three dimensions of space all around the support for the object being tested by at least one conductive wall forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers located in the intervals between the probes.
申请公布号 US9267967(B2) 申请公布日期 2016.02.23
申请号 US201113878311 申请日期 2011.10.07
申请人 Satimo Industries 发明人 Garreau Philippe;Duchesne Luc;Laporte Raphaël;Durand Ludovic
分类号 G01R1/073;G01R1/04;G01R29/08 主分类号 G01R1/073
代理机构 Lerner, David, Littenberg, Krumholz & Mentlik, LLP 代理人 Lerner, David, Littenberg, Krumholz & Mentlik, LLP
主权项 1. A device for the electromagnetic testing of at least one object, comprising: a network of electromagnetic probes for transmission and/or for reception of electromagnetic radiations towards or from the object being tested, a support structure for supporting the network of electromagnetic probes, the support structure comprising anechoic electromagnetic absorbers, and and a support for supporting the object being tested, wherein the support structure for supporting the network of electromagnetic probes comprises at least one conductive wall extending according to the three dimensions of space all around the support for the object being tested, to form a Faraday cage fully closed around the object being tested when the latter is on the support, wherein on its inner side turned towards the object being tested and the support, the anechoic electromagnetic absorbers are located in intervals between the electromagnetic probes, wherein the support structure comprises at least one upright to which the electromagnetic probes and the at least one conductive wall are fixed, wherein the anechoic electromagnetic absorbers are also provided on an inner side of the at least one upright in the intervals between the electromagnetic probes, wherein a closed volume delimited by the support structure contains a relative displacement system for relative displacement of the support relative to the support structure according to at least one degree of liberty, wherein the relative displacement system located inside the support structure is constituted by at least one first relative angular displacement system enabling at least one first determined sliding angular displacement of the support structure relatively to the support about a non-vertical geometric axis, wherein the support structure rests on a lower base, wherein provided between the lower base and the support structure is another angular displacement system enabling to displace the support structure relative to the lower base by a second angle, which is in a same vertical plane as the first determined sliding angular displacement, which is of the same absolute value as the first determined sliding angular displacement and which is opposite to the first determined sliding angular displacement of the first relative angular displacement system of the support relative to the support structure, so that the support for the object being tested retains a prescribed and substantially constant position relative to a vertical axis.
地址 FR