发明名称 Lithographic apparatus and device manufacturing method involving a heater and a temperature sensor
摘要 A lithographic apparatus is described having a liquid supply system configured to at least partly fill a space between a projection system of the lithographic apparatus and a substrate with liquid, a barrier member arranged to substantially contain the liquid within the space, and a heater.
申请公布号 US9268242(B2) 申请公布日期 2016.02.23
申请号 US201012869560 申请日期 2010.08.26
申请人 ASML NETHERLANDS B.V. 发明人 Cadee Theodorus Petrus Maria;Jacobs Johannes Henricus Wilhelmus;Kate Nicolaas Ten;Loopstra Erik Roelof;Vermeer Aschwin Lodewijk Hendricus Johannes;Mertens Jeroen Johannes Sophia Maria;De Mol Christianus Gerardus Maria;Muitjens Marcel Johannus Elisabeth Hubertus;Van Der Net Antonius Johannus;Ottens Joost Jeroen;Quaedackers Johannes Anna;Reuhman-Huisken Mana Elisabeth;Stavenga Marco Koert;Tinnemans Patricius Aloysius Jacobus;Verhagen Martinus Cornelis Maria;Verspay Jacobus Johannus Leonardus Hendricus;De Jong Frederik Eduard;Goorman Koen;Menchtchikov Boris;Boom Herman;Nihtianov Stoyan;Moerman Richard;Smeets Martin Frans Pierre;Schoondermark Bart Leonard Peter;Janssen Franciscus Johannes Joseph;Riepen Michel
分类号 G03F7/20 主分类号 G03F7/20
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic apparatus, comprising: a substrate table constructed to hold a substrate; a projection system configured to project a patterned radiation beam onto a target portion of the substrate; a liquid supply system configured to at least partly fill a space between the projection system and the substrate with liquid; a substrate temperature conditioning system configured to provide heat transfer to or from at least a portion of the substrate; a temperature sensor configured to determine a temperature; a substrate temperature control system configured to provide a control signal to control the substrate temperature conditioning system based on the determined temperature; and a parameter control system configured to adjust a lithographic apparatus parameter, that is other than, or in addition to, the control signal and a temperature of the liquid as being supplied to the space by the liquid supply system, based on temperature information of the substrate and/or substrate table or on a measure derived from the temperature information.
地址 Veldhoven NL