发明名称 |
Lithographic apparatus and device manufacturing method involving a heater and a temperature sensor |
摘要 |
A lithographic apparatus is described having a liquid supply system configured to at least partly fill a space between a projection system of the lithographic apparatus and a substrate with liquid, a barrier member arranged to substantially contain the liquid within the space, and a heater. |
申请公布号 |
US9268242(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201012869560 |
申请日期 |
2010.08.26 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
Cadee Theodorus Petrus Maria;Jacobs Johannes Henricus Wilhelmus;Kate Nicolaas Ten;Loopstra Erik Roelof;Vermeer Aschwin Lodewijk Hendricus Johannes;Mertens Jeroen Johannes Sophia Maria;De Mol Christianus Gerardus Maria;Muitjens Marcel Johannus Elisabeth Hubertus;Van Der Net Antonius Johannus;Ottens Joost Jeroen;Quaedackers Johannes Anna;Reuhman-Huisken Mana Elisabeth;Stavenga Marco Koert;Tinnemans Patricius Aloysius Jacobus;Verhagen Martinus Cornelis Maria;Verspay Jacobus Johannus Leonardus Hendricus;De Jong Frederik Eduard;Goorman Koen;Menchtchikov Boris;Boom Herman;Nihtianov Stoyan;Moerman Richard;Smeets Martin Frans Pierre;Schoondermark Bart Leonard Peter;Janssen Franciscus Johannes Joseph;Riepen Michel |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
Pillsbury Winthrop Shaw Pittman LLP |
代理人 |
Pillsbury Winthrop Shaw Pittman LLP |
主权项 |
1. A lithographic apparatus, comprising:
a substrate table constructed to hold a substrate; a projection system configured to project a patterned radiation beam onto a target portion of the substrate; a liquid supply system configured to at least partly fill a space between the projection system and the substrate with liquid; a substrate temperature conditioning system configured to provide heat transfer to or from at least a portion of the substrate; a temperature sensor configured to determine a temperature; a substrate temperature control system configured to provide a control signal to control the substrate temperature conditioning system based on the determined temperature; and a parameter control system configured to adjust a lithographic apparatus parameter, that is other than, or in addition to, the control signal and a temperature of the liquid as being supplied to the space by the liquid supply system, based on temperature information of the substrate and/or substrate table or on a measure derived from the temperature information. |
地址 |
Veldhoven NL |