发明名称 Semiconductor device and manufacturing method thereof, delamination method, and transferring method
摘要 A substrate and a delamination film are separated by a physical means, or a mechanical means in a state where a metal film formed over a substrate, and a delamination layer comprising an oxide film including the metal and a film comprising silicon, which is formed over the metal film, are provided. Specifically, a TFT obtained by forming an oxide layer including the metal over a metal film; crystallizing the oxide layer by heat treatment; and performing delamination in a layer of the oxide layer or at both of the interface of the oxide layer is formed.
申请公布号 US9269817(B2) 申请公布日期 2016.02.23
申请号 US201414223419 申请日期 2014.03.24
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Maruyama Junya;Takayama Toru;Ohno Yumiko;Yamazaki Shunpei
分类号 H01L29/786;H01L27/12 主分类号 H01L29/786
代理机构 Robinson Intellectual Property Law Office, P.C. 代理人 Robinson Eric J.;Robinson Intellectual Property Law Office, P.C.
主权项 1. A semiconductor device comprising: a flexible substrate; an oxide film; an insulating film comprising nitrogen over the oxide film; a semiconductor film over the insulating film; and a metal oxide layer in contact with a bottom side of the oxide film, wherein the metal oxide layer comprises crystal, and wherein the metal oxide layer is adhered to the flexible substrate with an adhesive material.
地址 Atsugi-shi, Kanagawa-ken JP