发明名称 |
Semiconductor device and manufacturing method thereof, delamination method, and transferring method |
摘要 |
A substrate and a delamination film are separated by a physical means, or a mechanical means in a state where a metal film formed over a substrate, and a delamination layer comprising an oxide film including the metal and a film comprising silicon, which is formed over the metal film, are provided. Specifically, a TFT obtained by forming an oxide layer including the metal over a metal film; crystallizing the oxide layer by heat treatment; and performing delamination in a layer of the oxide layer or at both of the interface of the oxide layer is formed. |
申请公布号 |
US9269817(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201414223419 |
申请日期 |
2014.03.24 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Maruyama Junya;Takayama Toru;Ohno Yumiko;Yamazaki Shunpei |
分类号 |
H01L29/786;H01L27/12 |
主分类号 |
H01L29/786 |
代理机构 |
Robinson Intellectual Property Law Office, P.C. |
代理人 |
Robinson Eric J.;Robinson Intellectual Property Law Office, P.C. |
主权项 |
1. A semiconductor device comprising:
a flexible substrate; an oxide film; an insulating film comprising nitrogen over the oxide film; a semiconductor film over the insulating film; and a metal oxide layer in contact with a bottom side of the oxide film, wherein the metal oxide layer comprises crystal, and wherein the metal oxide layer is adhered to the flexible substrate with an adhesive material. |
地址 |
Atsugi-shi, Kanagawa-ken JP |